Part 4/8:
The analysis took further strides when Grignia directly zoomed into different areas of the sample. Specific spots exhibited an intense disruption characterized by layered structures and recurrent pits. Within these pits, features were often apparent, potentially indicating varying material compositions. The microscopic imagery underscored the complexity of the irregular holes, each harboring distinct attributes.
Using secondary electrons in the scanning electron microscopy (SEM) setup permitted a clearer topological view, allowing for a more nuanced interpretation of these formations. Observations from this angle suggested a possible pattern of peaks and pits—an array of topographical highs and lows.